Structural analysis of zinc phthalocyanine (ZnPc) thin films: X-ray diffraction study
(2007)
Journal Article
Senthilarasu, S., Hahn, Y., & Lee, S. (2007). Structural analysis of zinc phthalocyanine (ZnPc) thin films: X-ray diffraction study. Journal of Applied Physics, 102(4), Article 043512. https://doi.org/10.1063/1.2771046
X-ray diffraction (XRD) was used to analyze the structure of thermally evaporated zinc phthalocyanine (ZnPc) organic thin films, as functions of the substrate temperature and film thickness. A metastable α to stable β phase transformation has been ob... Read More about Structural analysis of zinc phthalocyanine (ZnPc) thin films: X-ray diffraction study.