Dr Senthilarasu Sundaram S.Sundaram@napier.ac.uk
Associate Professor
Dr Senthilarasu Sundaram S.Sundaram@napier.ac.uk
Associate Professor
R. Sathyamoorthy
S. Lalitha
D.K. Avasthi
The Fe/Si multilayers were prepared by electron beam evaporation in a cryo-pumped vacuum deposition system. Ag+ and Au+ ions of 100 MeV at two different fluencies such as 1 × 1012 ions/cm2 and 1 × 1013 ions/cm2 at a pressure of 10− 7 torr were used to irradiate the Fe/Si samples. The irradiated samples were analyzed by High-Resolution XRD and it reveals that the irradiated films are having polycrystalline nature and it confirms the formation of the β-FeSi2. The structural parameters such as crystallite size (D), strain (ε) and dislocation density (δ) have been evaluated from the XRD spectrum. The role of the substrates and the influence of swift heavy ions on the formation of β-FeSi2 have been discussed in this paper.
Senthilarasu, S., Sathyamoorthy, R., Lalitha, S., & Avasthi, D. (2005). Structural properties of swift heavy ion beam irradiated Fe/Si bilayers. Thin Solid Films, 490(2), 177-181. https://doi.org/10.1016/j.tsf.2005.04.051
Journal Article Type | Article |
---|---|
Online Publication Date | May 25, 2005 |
Publication Date | Nov 1, 2005 |
Deposit Date | Mar 13, 2023 |
Print ISSN | 0040-6090 |
Electronic ISSN | 1879-2731 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 490 |
Issue | 2 |
Pages | 177-181 |
DOI | https://doi.org/10.1016/j.tsf.2005.04.051 |
Keywords | Fe/Si bilayer, Ion irradiation, β-FeSi2, Structural, Thin films |
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