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Structural properties of swift heavy ion beam irradiated Fe/Si bilayers

Senthilarasu, S.; Sathyamoorthy, R.; Lalitha, S.; Avasthi, D.K.

Authors

R. Sathyamoorthy

S. Lalitha

D.K. Avasthi



Abstract

The Fe/Si multilayers were prepared by electron beam evaporation in a cryo-pumped vacuum deposition system. Ag+ and Au+ ions of 100 MeV at two different fluencies such as 1 × 1012 ions/cm2 and 1 × 1013 ions/cm2 at a pressure of 10− 7 torr were used to irradiate the Fe/Si samples. The irradiated samples were analyzed by High-Resolution XRD and it reveals that the irradiated films are having polycrystalline nature and it confirms the formation of the β-FeSi2. The structural parameters such as crystallite size (D), strain (ε) and dislocation density (δ) have been evaluated from the XRD spectrum. The role of the substrates and the influence of swift heavy ions on the formation of β-FeSi2 have been discussed in this paper.

Journal Article Type Article
Online Publication Date May 25, 2005
Publication Date Nov 1, 2005
Deposit Date Mar 13, 2023
Print ISSN 0040-6090
Electronic ISSN 1879-2731
Publisher Elsevier
Peer Reviewed Peer Reviewed
Volume 490
Issue 2
Pages 177-181
DOI https://doi.org/10.1016/j.tsf.2005.04.051
Keywords Fe/Si bilayer, Ion irradiation, β-FeSi2, Structural, Thin films