Characterization of CdTe thin film—dependence of structural and optical properties on temperature and thickness
(2004)
Journal Article
Lalitha, S., Sathyamoorthy, R., Senthilarasu, S., Subbarayan, A., & Natarajan, K. (2004). Characterization of CdTe thin film—dependence of structural and optical properties on temperature and thickness. Solar Energy Materials and Solar Cells, 82(1-2), 187-199. https://doi.org/10.1016/j.solmat.2004.01.017
The X-ray diffraction analysis of vacuum-evaporated cadmium telluride (CdTe) films reveals that the structure of the films is polycrystalline in nature for the samples prepared at higher substrate temperatures. The crystallite size (D), dislocation d... Read More about Characterization of CdTe thin film—dependence of structural and optical properties on temperature and thickness.