Thermally evaporated ZnPc thin films—band gap dependence on thicknessp dependence on thickness

Senthilarasu, S.; Sathyamoorthy, R.; Lalitha, S.; Subbarayan, A.; Natarajan, K.

Abstract

The ZincPhthalocyanine (ZnPc) thin films were obtained by thermal evaporation method. The X-ray diffraction analysis of vacuum evaporated ZnPc films reveals that the structure of the film is polycrystalline in nature for the samples grown at higher substrate temperatures. The crystallite size (D), dislocation density (δ) and strain (ε) were calculated. The optical band gap energy has been calculated from the (αhν)2 vs. hν plot. The optical band gap energy of the ZnPc films was found to decrease with increase in film thickness.

Citation

Senthilarasu, S., Sathyamoorthy, R., Lalitha, S., Subbarayan, A., & Natarajan, K. (2004). Thermally evaporated ZnPc thin films—band gap dependence on thicknessp dependence on thickness. Solar Energy Materials and Solar Cells, 82(1-2), 179-186. https://doi.org/10.1016/j.solmat.2004.01.016

• Journal Article Type: Article
• Online Publication Date: Feb 6, 2004
• Publication Date: May 1, 2004
• Deposit Date: Mar 11, 2023
• Print ISSN: 0927-0248
• Publisher: Elsevier
• Peer Reviewed: Peer Reviewed
• Volume: 82
• Issue: 1-2
• Pages: 179-186
• DOI: https://doi.org/10.1016/j.solmat.2004.01.016
• Keywords: Thermal evaporation, Zincphthalocyanine, Organic semiconductor