Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems
(1998)
Journal Article
Wei, H., Johnston, E., & Binnie, D. (1998). Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), 2565. https://doi.org/10.1117/1.601778
This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained by deriving the modulation transfer function (MTF) from the measured contra... Read More about Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems.