Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems

Wei, Hong; Johnston, Eion; Binnie, David

Abstract

This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained by deriving the modulation transfer function (MTF) from the measured contrast transfer function (CTF). Basic signal- processing techniques are used to establish a relationship between the MTF and the CTF. Experimental methodology is discussed with respect to avoidance of shift variation in the CTF. Discrete Fourier transformation is applied for a power-spectrum analysis of the MTF. Using the CTF as a measure of performance, a series of experiments were carried out to characterize an imaging system based on an integrated CMOS camera. The experimental results showed that this approach can be applied in general, for the assessment of spatial resolution for digital imaging systems.

Citation

Wei, H., Johnston, E., & Binnie, D. (1998). Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), 2565. https://doi.org/10.1117/1.601778

• Journal Article Type: Article
• Publication Date: Sep 1, 1998
• Deposit Date: Sep 19, 2017
• Journal: Optical Engineering
• Print ISSN: 0091-3286
• Electronic ISSN: 1560-2303
• Publisher: Society of Photo-optical Instrumentation Engineers
• Peer Reviewed: Peer Reviewed
• Volume: 37
• Issue: 9
• Pages: 2565
• DOI: https://doi.org/10.1117/1.601778
• Keywords: Engineering(all); Atomic and Molecular Physics, and Optics
• Public URL: http://researchrepository.napier.ac.uk/Output/950979