T. David Binnie
Fast imaging Microlenses
Binnie, T. David
Authors
Abstract
A new type of imaging microlens, primarily for use with solid-state image-capture systems such as a charge coupled device (CCD) or metal oxide semiconductor array sensors, is described. The design, having less aberration than conventional lenses of similar specification, is particularly advantageous in wide-angle, low-light applications. The lens type is substantially simpler than any existing design. A particular example, a fixed focus f/3.5 lens with a 90° field of view and a depth of field from 2 cm to infinity, is detailed. The lens can be directly bonded to a solid-state array detector and requires no other mechanical support. The lens can be designed and manufactured at low cost and has current applications in surveillance and microscopy.
Citation
Binnie, T. D. (1994). Fast imaging Microlenses. Applied Optics, 33(7), 1170-1175. https://doi.org/10.1364/ao.33.001170
| Journal Article Type | Article |
|---|---|
| Acceptance Date | Nov 1, 1993 |
| Online Publication Date | Mar 1, 1994 |
| Publication Date | Mar 1, 1994 |
| Deposit Date | Dec 9, 2019 |
| Journal | Applied Optics |
| Print ISSN | 1559-128X |
| Electronic ISSN | 2155-3165 |
| Publisher | Optical Society of America |
| Peer Reviewed | Peer Reviewed |
| Volume | 33 |
| Issue | 7 |
| Pages | 1170-1175 |
| DOI | https://doi.org/10.1364/ao.33.001170 |
| Keywords | Atomic and Molecular Physics, and Optics |
| Public URL | http://researchrepository.napier.ac.uk/Output/950772 |