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Leveraging multiple datasets for deep leaf counting

Dobrescu, Andrei; Giuffrida, Mario Valerio; Tsaftaris, Sotirios A

Authors

Andrei Dobrescu

Mario Valerio Giuffrida

Sotirios A Tsaftaris



Abstract

The number of leaves a plant has is one of the key traits (phenotypes) describing its development and growth. Here, we propose an automated, deep learning based approach for counting leaves in model rosette plants. While state-of-the-art results on leaf counting with deep learning methods have recently been reported, they obtain the count as a result of leaf segmentation and thus require per-leaf (in-stance) segmentation to train the models (a rather strong annotation). Instead, our method treats leaf counting as a direct regression problem and thus only requires as annotation the total leaf count per plant. We argue that combining different datasets when training a deep neural network is beneficial and improves the results of the proposed approach. We evaluate our method on the CVPPP 2017 Leaf Counting Challenge dataset, which contains images of Arabidopsis and tobacco plants. Experimental results show that the proposed method significantly outperforms the winner of the previous CVPPP challenge, improving the results by a minimum of 50% on each of the test datasets, and can achieve this performance without knowing the experimental origin of the data (i.e. "in the wild" setting of the challenge). We also compare the counting accuracy of our model with that of per leaf segmentation algorithms, achieving a 20% decrease in mean absolute difference in count (|DiC|).

Citation

Dobrescu, A., Giuffrida, M. V., & Tsaftaris, S. A. (2017, October). Leveraging multiple datasets for deep leaf counting. Presented at 2017 IEEE International Conference on Computer Vision Workshops (ICCVW), Venice, Italy

Presentation Conference Type Conference Paper (Published)
Conference Name 2017 IEEE International Conference on Computer Vision Workshops (ICCVW)
Start Date Oct 22, 2017
End Date Oct 29, 2017
Acceptance Date Aug 1, 2017
Online Publication Date Jan 23, 2018
Publication Date Jan 23, 2018
Deposit Date Sep 24, 2019
Publisher Institute of Electrical and Electronics Engineers
Series ISSN 2473-9944
DOI https://doi.org/10.1109/ICCVW.2017.243
Keywords Training, Image segmentation, Machine learning, Testing, Computer vision, Shape, Conferences
Public URL http://researchrepository.napier.ac.uk/Output/2157942