Microelectronic systems: design, modelling and test.

Buchanan, William J

Abstract

This text provides a comprehensive overview of the design, modellng and testing of microelectronic systems. It begins with a brief introduction to the history and development of microelectronics before discussing Bi-Polar and MOS Design (including CMOS and NMOS). After looking at memory systems and field programmable gate arrays it then goes on to explore all aspects of modelling, including VHDL, PSPICE and fault modelling. The third section looks at practical testing of systems, including a discussion of designing for testability and memory tests. This book finishes with a number of appendices that provide vital reference material for MOS characteristics, IC fabrication, design rules, VHDL and PSPICE references, including an excellent PSPICE tutorial.

This comprehensive coverage, from conception, through modelling to testing, of these key systems provides a fully up-to-date account that will prove invaluable for all those with an interest in microelectronics. --This text refers to an alternate Paperback edition.

Citation

Buchanan, W. J. (1997). Microelectronic systems: design, modelling and test. Arnold

• Book Type: Authored Book
• Publication Date: 1997
• Deposit Date: Dec 22, 2010
• Publicly Available Date: Dec 22, 2010
• Peer Reviewed: Peer Reviewed
• Book Title: Microelectronic Systems: Design, Modelling and Test
• ISBN: 0-340-67771-6
• Keywords: Microelectronic systems; Bi-Polar; MOS design; memory systems; gate arrays; VHDL; PSPICE; fault modelling
• Public URL: http://researchrepository.napier.ac.uk/id/eprint/4012
• Contract Date: Dec 22, 2010